Excitation: SPECTRO MIDEX utilizes an air-cooled low power X-ray tube with micro focus for collimated point sample excitation.With the incorporation of software controlled collimators, optional the size of the measuring spot can be selected in several steps between 200 µm and 4 mm; enabling it to be optimized for a whole range of applications.

Detector: The high-resolution detection system consists of a Si drift detector (SDD) with electrical Peltier-cooling.The system processes up to 250,000 pulses per second; making it more than twice as fast as instruments with conventional technology.

Sample: For a fast point analysis of an unknown sample, it is possible to determine all relevant elements from magnesium to uranium in less than two minutes.The SPECTRO MIDEX is equipped with a spaciously dimensioned sample chamber. Even when closed, it is possible to look into the chamber through the viewing window that can also be shuttered.The sample chamber has a large opening, making it very accessible so that samples can be easily placed into and removed from the chamber. An integrated video system permits exact measurement positioning.

Analysis: The long travel path of the optional motor driven XYZ table enables line scans and mappings of large sample surfaces.With the optional large working distance of 20 mm from the sample in SPECTRO MIDEX LD (long distance) it is possible to conduct analyses of the “valleys” between components. This is also true for irregularly formed jewellery or, for example, examination of the inside of rings.The optional XYZ table can also be used as a sample changer: After the software supported setting of positions, it is possible to automatically measure a large number of samples.Helium flushing is available for the analysis of light elements. This has no undesired influences on the sample, as can be the case when a vacuum system is used. Because it is only flushed in the immediate area of the measuring spot, the maximum helium consumption is less than 100 litres per hour.

Software: The user interface allows quick and easy point measurements. Position the sample in focus, enter the sample name and start the analysis.Setting up a measuring cycle with the optional xyz-stage is easier than ever. Just place the sample on the tray; a quick step-by-step procedure guides through defining point scans, line scans and mappings.Fundamental parameter method FP+ for fast and precise analysis of many types of alloys.RoHS compliance screening of polymers and other matrices.