Polarised High Resolution EDXRF Analyser: Spectro iQII
The SPECTRO iQ II into the same performance class as the much more expensive wavelength dispersive X-ray fluorescence spectrometers. Applications such as trace element analysis, that were previously the domain of these types of instruments, can now be handled using SPECTRO’s unique energy-dispersive ED-XRF spectrometer technology.
Excitation: The combination of a low-power X-ray tube and the advanced C-Force polarization optical system ensures optimum excitation of the elements in the sample.
The close coupled, form-optimized, HOPG crystal used to reflect the excitation radiation is located extremely close to the sample, resulting in significantly improved analytical performance for light elements such as Na, Mg, Al, Si, P, S and Cl.
The sample chamber can be either evacuated or flushed with helium to further enhance the performance of the light elements.
Sample Presentation: The SPECTRO iQ II is designed to allow the use of a new generation of sample cups. They can be very accurately positioned, contributing to increased measurement precision. When analyzing liquids, powders or pressed pellets, a safety window can be fitted to the cup to prevent instrument contamination.
Samples can be exchanged without switching off the X-ray tube, ensuring maximum reliability, a higher sample throughput and extended instrument performance.
Detector: An exceptionally powerful silicon drift detector – technologically derived from the detector in the premium performance XEPOS model – is used in the iQ II.
The high spectral resolution and the good signal to background ratios are the basis for low detection limits, especially in difficult matrices. With the high-count rate processing capability, the operator simultaneously profits from excellent reproducibility and accuracy with short measurement times.
Analysis: For many applications the measurement precision of major components and the sensitivity for important trace elements place the iQ II into the same performance class as the much more expensive wavelength dispersive X-ray fluorescence spectrometers.
Applications that were previously the domain of these types of instruments can now be handled using SPECTRO’s unique energy-dispersive technology.
The determination of ultra-low sulfur contents in fuels can be accomplished in just a few hundred seconds. For a wide range of production processes, the iQ II also offers exceptional analytical performance for important low atomic number elements.
Software: Clarity, simplicity and focus are all hallmarks of the iQ II software. The new graphical user interface displays all the important functions for routine operation at a glance.
A touch screen can make operation even less complicated and more intuitive.
The factory-calibrated, norm compliant, application packages are easily customized to meet individual analytical requirements. If no standards or information about the contents of a sample are available, the optional fundamental parameters method can be used to perform a screening analysis.
- Ultra-low Sulfur in fuel
- Additives in oil