TIMA-X

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TIMA-X is an automated mineralogy system enabling fast quantitative analysis of rocks, ores, concentrates, tailings, leach residues or smelter products.The new detectors on TIMA-X are specially designed to increase sensitivity to light elements and maintain excellent resolution stability at high throughput rates without compromising the interactive and automated performance.

Features

Very fast and fully automated data acquisition process reached via SEM and EDX high level hardware integration
EDAX Element Silicon Drift Detectors
New design of 30 mm2 SDD CMOS chip
Si3N4 window is rugged, non-porous and has high transmissivity
Improved sensitivity to low energies for light element detection
Pulse processor software integration
Compatible with EDAX Quant hardware and with EDAX µXRF
Newly designed exchangeable sample holder with integrated fixed BSE/EDX calibration standard and Faraday cup
Up to 4 integrated EDX detectors for maximum system performance
New Peltier cooled EDX detector type for thermal stability guarantee
Improved approach to data analysis increasing speed and reliability od process
Variable dwell time and EDX analysis duration adapting to each part of the sample
Offline data inspection