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Horiba Jobin Yvon S.A.S
Inductively Coupled
Plasma Atomic Emission
Spectrometer-ICP OES
Glow Discharge Optical
Emission Spectrometer: GD
Profiler 2
TM
Plasma Profiling
Time-Of-Flight
Mass Spectrometer
Particle Size Analyzer
NanoPartica SZ-100V2 Series
Partica LA-960V2
Applied Rigaku Technologies Inc
NEX CG II
NEX DE
NEX DE VS
NEX QC Series
NEX QC+ QuantEZ
CHNOS Analyser
EMIA-Expert
EMIA-Step
EMGA-930
EMGA-920
EMGA-921
Aurora
TRACE AI1200 Plus
Atomic Absorption
Spectrometer
TRACE 1800 Atomic
Absorption Spectrometer
Arun Technology
CALIBUS LIBS
ARTUS 10
ARTUS 8
MERLIN4
Hand Held XRF ( HELIUS )
Atomtrace
LIBS Interaction Chamber
LIBS Sci-Trace
LIBS M-Trace
LIBS X-Trace
LIBS Application Setup
LIBS Software AtomAnalyzer
Digital Delay Generator
Dott. Gianni Scavini & C.SNC
Petroleum Testing Instrument
Tec5 AG
Process Spectroscopy
UV-VIS System
NIR System
RAMAN System
LIBS System
Levitators
Forensics Investigation Instruments – Horiba
Forensics Focus LED
Universal Imaging System
Focus LED
Focus PRO
Handscope Laser
Handscope LED
Image Enhancement Software
Mini Crime Scope
AFIS-APIS System
Services & Support
Downloads
Career
Contact Us
Menu
Home
Profile
Products
Horiba Jobin Yvon S.A.S
Inductively Coupled
Plasma Atomic Emission
Spectrometer-ICP OES
Glow Discharge Optical
Emission Spectrometer: GD
Profiler 2
TM
Plasma Profiling
Time-Of-Flight
Mass Spectrometer
Particle Size Analyzer
NanoPartica SZ-100V2 Series
Partica LA-960V2
Applied Rigaku Technologies Inc
NEX CG II
NEX DE
NEX DE VS
NEX QC Series
NEX QC+ QuantEZ
CHNOS Analyser
EMIA-Expert
EMIA-Step
EMGA-930
EMGA-920
EMGA-921
Aurora
TRACE AI1200 Plus
Atomic Absorption
Spectrometer
TRACE 1800 Atomic
Absorption Spectrometer
Arun Technology
CALIBUS LIBS
ARTUS 10
ARTUS 8
MERLIN4
Hand Held XRF ( HELIUS )
Atomtrace
LIBS Interaction Chamber
LIBS Sci-Trace
LIBS M-Trace
LIBS X-Trace
LIBS Application Setup
LIBS Software AtomAnalyzer
Digital Delay Generator
Dott. Gianni Scavini & C.SNC
Petroleum Testing Instrument
Tec5 AG
Process Spectroscopy
UV-VIS System
NIR System
RAMAN System
LIBS System
Levitators
Forensics Investigation Instruments – Horiba
Forensics Focus LED
Universal Imaging System
Focus LED
Focus PRO
Handscope Laser
Handscope LED
Image Enhancement Software
Mini Crime Scope
AFIS-APIS System
Services & Support
Downloads
Career
Contact Us
Horiba Jobin Yvon S.A.S
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Inductively Coupled Plasma Atomic Emission Spectrometer-ICP OES
The ICP OES has high quality optical design which integrates a high density holographic grating and one meter focal length
Glow Discharge Optical Emission Spectrometer: GD Profiler 2TM
Material studies, process elaboration and control as it offers ultra fast elemental depth profile analysis of thin and thick layers, conductive
Plasma Profiling Time Of Flight Mass Spectrometer
PP-TOFMS couples a glow discharge plasma to an ultra-fast time of flight mass spectrometer and provides chemical analysis
