The Lattice Series redefines benchtop X-ray diffraction by combining high-power performance with compact design. Equipped with a powerful 600 W (Lattice Mini) or 1600 W X-ray source and a high-efficiency, direct-read 2D photon detector, the Lattice Series delivers exceptional data intensity and accuracy—making it ideal for demanding analytical environments.
Available in three configurations—Lattice Mini, Lattice Basic, and Lattice Pro—this series accommodates a wide range of technical and budgetary needs, from simple phase identification to complex in-situ studies. All models offer excellent signal-to-noise ratio and fast scan speeds, providing lab-grade data from a desktop system.
Whether you’re analyzing complex powders, crystalline materials, or conducting highthroughput measurements, the Lattice Series provides lab-grade results with speed, power, and precision—all in a desktop footprint.

Features

High-Power X-ray Source
Choose between 600 W or 1600 W configurations for high-intensity data collection and rapid scanning.
2D Photon Direct-Read Detector
A 256 × 256 pixel array captures sharp, high-resolution diffraction patterns with an excellent signal-to-noise ratio.
Exceptional Angular Accuracy
Achieve step sizes as small as ±0.01° 2θ and ensure a consistent peak matching with standard reference materials.
Flexible Goniometer Options
Theta–2Theta geometry for standard analysis (Mini & Basic) or Theta–Theta for enhanced sample stability (Pro).
Fast, Reliable Scanning
Obtain full-spectrum data in minutes—ideal for routine QA and high-throughput labs.
Compact Benchtop Design
Fits seamlessly into modern lab environments without sacrificing performance or requiring floor space.
Expandable Functionality (Lattice Pro)
Supports advanced modules for residual stress testing, high-temperature stages, in-situ battery studies, and thin film analysis.
User-Friendly Operation
Intuitive software and streamlined hardware design simplify training and daily use.

Specifications

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