NEX CG II +
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Applied Rigaku Technologies announces the release of NEX CG II+, its most powerful benchtop energy dispersive X-ray fluorescence (EDXRF) spectrometer. This next-generation, high-end spectrometer performs non-destructive analysis of sodium to uranium in a variety of sample types. It offers users fast, reliable measuring and monitoring for ultra-low and trace element concentrations up to high weight percent levels.
Short Description:
NEX CG II+ is well-suited for trace element analysis for pharmaceutical materials, catalysts, cosmetics, monitoring for toxic metals in aerosols on air filters, as well as analyzing trace heavy metals and rare earth elements (REE), and other applications requiring a high degree of sensitivity.
Full Description:
NEX CG II+ is Rigaku’s most powerful indirect excitation EDXRF system yet. It reinvents XRF with a high-power 65 kV, 100 W X-ray tube, five secondary targets covering the complete elemental range sodium through uranium, and a large-area, high-throughput silicon drift detector (SDD). Like the NEX CG II model, NEX CG II+ features a unique close-coupled Cartesian Geometry optical kernel. This 3D configuration, high voltage, and power eliminate background noise and deliver high count rates, allowing for more signal in the detector. This powerful, unprecedented combination results in exceptionally low detection limits and excellent spectral resolution for trace peaks in applications requiring superior sensitivity.
Unlike conventional EDXRF spectrometers, NEX CG II Series are indirect excitation systems using
secondary targets rather than tube filters. Monochromatic and polarized excitation from secondary
targets vastly improves detection limits for elements in highly scattering matrices like water,
hydrocarbons, and biological materials. Secondary target excitation in full 90° Cartesian Geometry
eliminates background noise. As a result, the NEX CG II Series spectrometers bring a new level of
analytical sensitivity to XRF technology. Users can measure ultra-low and trace element
concentrations, even in challenging sample types.
Using user-friendly software, setting measurement conditions and analysis operations is intuitive and available in multiple languages. Users can maximize their time and productivity with simplified routine operations and create their own methods using a simple flow bar wizard. Rigaku’s advanced RPF-SQX Fundamental Parameters software, featuring Rigaku Profile Fitting technology and Scattering FP, enables semi-quantitative analysis of almost all sample types without standards and rigorous quantitative analysis with standards. Various software features are available to meet user needs, including SureDI, supporting compliance with 21 CFR Part 11.
In addition, users can obtain high-throughput measurements with various autosampler options, accommodating 32-, 40-, and 52-mm samples. NEX CG II+ does not require cooling water or liquid nitrogen, and the enclosure measures 463 mm (W) × 492 mm (D) × 382 mm (H). This smaller footprint makes it an attractive instrument for any commercial lab or R&D facility.
NEX CG II+ comes packed with the same generous list of standard features and options as NEX CG II — plus more. Some of the key advantages and features that make NEX CG II+ an attractive choice include:
Features
- Non-destructive elemental analysis for sodium (Na) to uranium (U)
- Rapid elemental analyses of solids, liquids, powders, coatings, and thin films
- Indirect excitation for exceptionally low detection limits
- High-power 65 kV, 100 W X-ray tube for high count rates
- Large-area high-throughput silicon drift detector (SDD)
- Analysis in air, helium, or vacuum
- Powerful and easy-to-use QuantEZ® software with a multilingual user interface
- Advanced RPF-SQX Fundamental Parameters software featuring Scattering FP
- Rigaku Profile Fitting (RPF) advanced algorithm for peak deconvolution
- Various automatic sample changers accommodating up to 52 mm samples
- Low cost of ownership backed by a 2-year warranty