NEX CG II

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High-performance indirect excitation EDXRF for complex applications with trace elements and variable base matrices
Short Description:
NEX CG II Series spectrometers solve elemental analysis challenges using a unique Cartesian Geometry optical kernel for the highest sensitivity. These instruments are ideal for ultra-low and trace-level performance, excelling at complex applications with trace elements and variable base matrices.
Full Description:
The Rigaku NEX CG II Series are powerful second-generation benchtop energy dispersive X-ray fluorescence (EDXRF) spectrometers. They perform rapid qualitative and quantitative elemental analyses and address needs across many industries. NEX CG II Series spectrometers serve a broad range of applications and are ideal for measuring ultra-low and trace element concentrations up to percent levels.
Unlike conventional EDXRF spectrometers, NEX CG II Series are indirect excitation systems using secondary targets rather than tube filters. Monochromatic and polarized excitation from secondary targets vastly improves detection limits for elements in highly scattering matrices like water, hydrocarbons, and biological materials. Secondary target excitation in full 90° Cartesian Geometry eliminates background noise. As a result, the NEX CG II Series spectrometers bring a new level of analytical sensitivity to XRF technology. Users can measure ultra-low and trace element concentrations, even in challenging sample types.
Models include NEX CG II for excellent spectral resolution for trace peaks or NEX CG II+ for more demanding applications requiring a higher-powered system.
NEX CG II Series spectrometers are well suited for the following applications:
NEX CG II Series - Key Advantages and Features
NEX CG II Series - Specifications
Technique Indirect excitation energy dispersive X-ray fluorescence (EDXRF)
Benefit Excel in complex applications with trace elements and variable base matrices; analyze solids, liquids, powders, coatings, and thin films
Technology 3D Cartesian geometry energy dispersive XRF (EDXRF) using a large-area high- throughput silicon drift detector (SDD)
Attributes High-power X-ray tube (50 kV 50 W or 65 kV 100 W), large-area high-throughput SDD, analyze Na to U
Software QuantEZ for control of spectrometer functions and data analysis
Options Vacuum, helium purge, automatic sample changers, sample spinner tray, external PC with Microsoft Windows operating system, UPS, RPF-SQX Fundamental Parameters with Rigaku Scattering FP, SureDI support for 21 CFR Part 11 compliance, other software features
Dimensions 46.3 (W) x 49.2 (D) x 38.2 (H) cm
Mass Approx. 65 kg (NEX CG II); approx. 68 kg (NEX CG II+)
Power requirements 1Ø, 100 – 240 V, 3.8 – 1.6 A (50/60 Hz) or 100 – 240 V, 5.2 – 2.6 A (50/60 Hz)
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