| Technique | Indirect excitation energy dispersive X-ray fluorescence (EDXRF) |
|---|---|
| Benefit | Excel in complex applications with trace elements and variable base matrices; analyze solids, liquids, powders, coatings, and thin films |
| Technology | 3D Cartesian geometry energy dispersive XRF (EDXRF) using a large-area high- throughput silicon drift detector (SDD) |
| Attributes | High-power X-ray tube (50 kV 50 W or 65 kV 100 W), large-area high-throughput SDD, analyze Na to U |
| Software | QuantEZ for control of spectrometer functions and data analysis |
| Options | Vacuum, helium purge, automatic sample changers, sample spinner tray, external PC with Microsoft Windows operating system, UPS, RPF-SQX Fundamental Parameters with Rigaku Scattering FP, SureDI support for 21 CFR Part 11 compliance, other software features |
| Dimensions | 46.3 (W) x 49.2 (D) x 38.2 (H) cm |
| Mass | Approx. 65 kg (NEX CG II); approx. 68 kg (NEX CG II+) |
| Power requirements | 1Ø, 100 – 240 V, 3.8 – 1.6 A (50/60 Hz) or 100 – 240 V, 5.2 – 2.6 A (50/60 Hz) |
