• Analyze ₁₁Na to ₉₂U non-destructively

• Solids, liquids, powders and thin films

• Polarized excitation for lower detection limits

• Novel treatment of peak overlap reduces errors

• PPB detection limits for aqueous samples using UltraCarry

• Simplified user interface with EZ Analysis

Polarized cartesian geometry for trace level sensitivity

Unlike conventional EDXRF analyzers, the NEX CG was engineered with a unique close-coupled Cartesian Geometry (CG) optical kernel that dramatically increases signal-to-noise. By using secondary target excitation, instead of convention direct excitation, sensitivity is further improved. The resulting dramatic reduction in background noise, and simultaneous increase in element peaks, result in a spectrometer capable of routine trace element analysis even in difficult sample types.

NEX CG is powered by a new qualitative and quantitative analytical software, RPF-SQX, that features Rigaku Profile Fitting (RPF) technology. The software allows semi-quantitative analysis of almost all sample types without standards — and rigorous quantitative analysis with standards.