Home > Products > Applied Rigaku Technologies Inc.
| Technique | Direct excitation energy dispersive X-ray fluorescence (EDXRF) |
|---|---|
| Benefit | High-performance results when analysis time or sample throughput is critical;
analyze solids, liquids, powders, coatings, and thin films Integrated camera and small spot analysis (NEX DE VS model) |
| Technology | Energy dispersive XRF (EDXRF) using high-performance silicon drift detector (SDD) |
| Attributes | 60 kV 12 W X-ray tube with automated tube filters, high-performance SDD, analyze Na to U |
| Software | QuantEZ for control of spectrometer functions and data analysis |
| Options | Vacuum (NEX DE model), helium purge, automatic sample changers, single- position sample spinner, external PC with Microsoft® Windows® operating system, UPS, RPF-SQX Fundamental Parameters with Rigaku Scattering FP, SureDI support for 21 CFR Part 11 compliance, other software features |
| Dimensions | 356 (W) x 260 (H) x 351 (D) mm |
| Mass | Approx. 27 kg (core unit) |
| Power requirements | 1Ø, 100 – 240 V, 1.5 A (50/60 Hz) |
