NEX QC II Series
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Quality Control That Doesn’t Slow You Down
Production teams need fast elemental analysis without adding complexity to the process. Systems that require specialized training,
expensive consumables, or frequent maintenance can slow operations and increase costs.
The NEX QC II Series is engineered for dependable, everyday industrial use and uses energy dispersive X-ray fluorescence (EDXRF)
technology for rapid, non-destructive elemental analysis. Its compact, self-contained design—featuring an embedded computer
and built-in printer—eliminate PCs or peripherals on the plant floor. The clear, icon-driven touchscreen interface guides users from
setup to results, minimizing training time and reducing operator error.
With no technical background required, no expensive consumables, minimal sample preparation, and low operating costs,
the NEX QC II Series provides dependable EDXRF quality control performance that supports uptime, efficiency, and cost control.
- Fast, multi-element analysis
- Low ppm to high wt%
- Easy to learn, easy to operate
- Compact, rugged design
- No external PC, built-in printer
- No expensive consumables
- Low total cost of ownership
Fast, Reliable Elemental Analysis Within Reach for Any Quality Control Lab or Production Facility
A New Generation of EDXRF Benchtops for Today’s QC
Backed by Rigaku
The NEX QC II Series represents the next evolution in benchtop
EDXRF, a proven and cost-effective technology used for fast,
non-destructive elemental analysis. Whether you are new to
EDXRF or replacing an older instrument, the NEX QC II platform
delivers the performance, durability, and simplicity for modern
QC demands.
This second-generation design features graphene window
silicon drift detectors (SDDs), an updated optics configuration,
upgraded processing electronics, improved detector
protection, and a redesigned touchscreen interface. These
upgrades result in a versatile, easy-to-use benchtop designed
for routine QC across production floors, manufacturing lines,
and laboratory settings.
The series includes two models, the NEX QC II and the NEX QC II+,
to accommodate different performance needs and budgets.
Key Advantages & Features
- Non-destructive elemental analysis from sodium (Na) to uranium (U)
- Measures solids, liquids, powders, coatings, and thin films
- Redesigned touchscreen interface for simplified training and operation
- Compact, rugged design for demanding industrial environments
- Graphene window SDDs with enhanced detector configuration on the NEX QC II+
- Reinforced detector window protection for continuous industrial use
- Smaller footprint with built-in printer; no external computer required
- Low cost of ownership backed by a 2-year warranty
Improvements in Performance, Reliability, and Day-to-Day Usability
The NEX QC II Series builds on the proven NEX QC platform with upgrades that directly support industrial quality control. Every
aspect of the system has been refined to help QC teams work faster, maintain uptime, and control operating costs in real-world
production environments.
| Feature | Description |
|---|---|
| Graphene window SDD | Large area silicon drift detectors with graphene windows replace legacy beryllium window detectors, delivering higher resolution and improved sensitivity for routine and demanding QC tasks. |
| Optics and electronics | An optimized tube-to-sample geometry and larger detector active area enhance overall measurement performance. Improved detector collimation reduces stray lines and provides added detector protection. Updated electronics further improve signal quality and help support reliable everyday operation. |
| Touchscreen interface | A redesigned icon-driven touchscreen interface with guided setup makes it easy for operators to obtain fast, reliable, results, even with limited technical background |
| Detector protection | A new configuration protects the detector from direct exposure, including during routine window film changes, providing an additional layer of protection. This proven design, used in the NEX DE Series, has demonstrated robust detector protection in continuous industrial use. |
| Smaller footprint | A more compact, lightweight design saves space in labs and on crowded plant floors. With dimensions of 28.7 (W) × 46.5 (D) × 26.2 (H) cm (11.3 × 18.3 × 10.3 in) and a weight of approximately 15.5 kg (34 lbs), it fits easily into small or remote QC stations, and an optional carrying case supports portable use when needed. |
The NEX QC II Series offers two detector configurations so you can match analytical performance to your specific QC needs and
budget. Both models share the same compact, self-contained benchtop platform with an integrated computer, built-in printer, and
intuitive touchscreen interface. The difference lies in detector performance, not complexity of operation.
Specifications
General
- Direct excitation energy dispersive X-ray fluorescence (EDXRF)
- Analytical range Na to U
- PPM to % levels
Excitation
- X-ray tube, end window transmission with Ag anode
- 50 kV X-ray tube
- 4 W max power
- 6 tube filter positions
- X-rays only on when analyzing
Detection
- High-performance, large-area SDD with graphene window
- <170 eV resolution, 20 mm2 active area (NEX QC II)
- <135 eV resolution, 30 mm2 active area (NEX QC II+)
- Peltier electronic cooling
- User configurable shaping times for optimum balance of spectral resolution and count rate
Sample chamber
- Large 190 x 165 x 60 mm sample chamber
- Single-position 32 mm sample aperture with leak protection
- 25 mm ID flat sample ring for large samples
Environmental conditions
- Ambient temperature 10 – 35°C (50 – 95°F)
- Relative humidity ≤85% non-condensing
- Vibration undetectable by human
- Free from corrosive gas, dust, and particles
Spectrometer data
| Feature | Description |
|---|---|
| Helium purge | Flow rate 0.2 L/min (during analysis only) Helium purity 99.95% Tubing 6 mm OD x 4 mm ID, 10 meters |
| Single phase AC | 100 – 240 V, 1.15 A (50/60 Hz |
| Dimensions | 28.7 (W) x 46.5 (D) x 26.2 (H) cm (11.3 x 18.3 x 10.3 in) |
| Weight | 15.5 kg (34 lbs) |
Software
- Icon-driven graphical user interface
- Simple flow bar design to create new applications
- Qualitative and quantitative analysis
- Single or dual point standardization
- 6 pre-configured validation schemes with user defined bounds
- User-configurable repeat analysis
- Live results update
- Analysis Complete Remove Sample warning feature
- Data export function with LIMS capability
- Application method export/import to USB or network folder
- Password protection
- Multi-language
User Interface
- 7” HD touchscreen interface
- Embedded computer
- LINUX® operating system
- Internal thermal printer
- USB and Ethernet connections
Backed by Rigaku
Since its inception in 1951, Rigaku has been at the forefront of analytical and industrial instrumentation technology. With hundreds of major innovations to their credit, the Rigaku group of companies are world leaders in the field of analytical X-ray instrumentation. Rigaku employs over 2,000 people worldwide in operations based in Japan, the U.S., Europe, South America, and China.
Since its inception in 1951, Rigaku has been at the forefront of analytical and industrial instrumentation technology. With hundreds of major innovations to their credit, the Rigaku group of companies are world leaders in the field of analytical X-ray instrumentation. Rigaku employs over 2,000 people worldwide in operations based in Japan, the U.S., Europe, South America, and China.
| Helium purge | Flow rate 0.2 L/min (during analysis only) Helium purity 99.95% Tubing 6 mm OD x 4 mm ID, 10 meters |
| Single-position 40 mm sample aperture | |
| Single-position 32 mm sample spinner | |
| 6-position automatic sample changer (32 mm samples) | |
| 5-position automatic sample changer (35 – 40 mm samples) | |
| Uninterruptible power supply (UPS) 865 W / 1500 VA battery backup / transient surge protection | |