Field Emission Scanning Electron Microscope | SEM5000 - Advance Scientific Equipment Pvt. Ltd.

Field Emission Scanning Electron Microscope | SEM5000

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CIQTEK SEM5000 is a high-resolution, feature-rich field emission scanning electron microscope (FE-SEM, FEG SEM). Advanced column design, high voltage tunneling technology (SuperTunnel), low aberration non-leakage magnetic objective lens design, to achieve low-voltage high-resolution imaging, while magnetic samples can be applied. Optical navigation, advanced automatic functions, well-designed human-machine interaction, and optimized operation. Whether experienced or not, one can quickly get started with high-resolution shooting tasks.

Accesories

Autosampler AS-500 with optional rinse station Argon humidifier.
Introduction system kits for improved performance (small volume, organics, Hydrofluoric acid, high total dissolved solids).
Concomitant Metals Analyzer for simultaneous measurement of hydride forming elements and other elements.
Oxygen kit for alkali elements in organics.

Features

High-resolution imaging at low accelerating voltage.
The electromagnetic compound mirror reduces aberrations, significantly improves resolution at low voltages, and allows observation of magnetic samples.
High-pressure tunneling technology (SuperTunnel), where the electrons in the tunnel can maintain high energy, reducing space charge effects and ensuring low voltage resolution.
The electronic optical path without crossover effectively reduces system aberration and improves resolution.
Water-cooled constant temperature objective lens, to ensure the stability, reliability, and repeatability of the objective lens work.
Magnetic deflection six-hole adjustable diaphragm, automatic switching diaphragm hole, no mechanical adjustment, to achieve high-resolution observation or large beam analysis mode fast switching.

Specifications

Applications

Parameters

Key Parameters	Resolution	1.0 nm @ 15 kV, SE 1.5 nm @ 1 kV, SE0.8 nm @ 30 kV, STEM
	Acceleration voltage	20 V ~ 30 kV
	Magnification	1 ~ 2,500,000 x
	Electron Gun	High brightness Schottky Field Emission Electron Gun
Sample Chamber	Vacuum System	Fully automatic control, oil-free vacuum system
	Camera	Dual Cameras (Optical navigation + in-bin monitor)
	Distance	X: 120 mm, Y: 115 mm, Z: 50 mm T: -10°～ +90°, R: 360° (*Optional extra-large bin version available)
Detectors and Extensions	Standard	The high-angle electronic detector in the lens column The side low-angle electronic detector
Detectors and Extensions	Optional	Flush-mounted mid-angle backscattered electron detector Automatic retractable scanning transmission electron microscopy (STEM) detector Sample exchange chamber High-speed beam gate and electron beam exposure Energy dispersive spectroscopy (EDS/EDX) Electron Backscatter Diffraction (EBSD) Electron-beam-induced current (EBIC) Cathodoluminescence (CL) High and low temperature in-situ stretching table nanoManipulator Large-Scale Image StitchingTrackball & Knob Control Panel
Software	Operating System	Windows
	Navigation	Optical Navigation, Gesture Quick Navigation
	Automatic Functions	Auto Brightness Contrast, Auto Focus, Automatic Dissipation