| Models | SEM3200A | SEM3200 | ||
|---|---|---|---|---|
| Electro-Optical Systems | Electron Gun | Pre-aligned medium-sized fork-type tungsten filament | ||
| Resolution | High Vaccum | 3 nm @ 30 kV (SE) | ||
| 4 nm @ 30 kV (BSE) | ||||
| 8 nm @ 3 kV (SE) | ||||
| *Low Vaccum | 3 nm @ 30 kV (SE) | |||
| Magnification | 1-300,000x (Film Magnification) | |||
| 1-1000,000x (Screen Magnification) | ||||
| Acceleration Voltage | 0.2 kV ~ 30 kV | |||
| Probe Current | ≥1.2μA, Real-time display | |||
| Imaging Systems | Detector | Secondary Electron Detector (ETD) | ||
| *Backscattered electron detector (BSED), *low vacuum secondary electron detector, *energy spectrometer EDS, etc. | ||||
| Image Format | TIFF, JPG, BMP, PNG | |||
| Vacuum System | Vacuum Model | High Vacuum | Better than 5×10-4 Pa | |
| Low Vacuum | 5 ~ 1000 Pa | |||
| Control Mode | Fully automatic control | |||
| Sample Chamber | Camera | Optical Navigation | ||
| Monitoring in the Sample Chamber | ||||
| Sample Table | Three Axis Automatic | Five Axis Automatic | ||
| Distance | X: 120 mm | X: 120 mm | ||
| Y: 115 mm | Y: 115 mm | |||
| Z: 50 mm | Z: 50 mm | |||
| / | R: 360° | |||
| / | T: -10° ~ +90° | |||
| Software | Operating System | Windows | ||
| Navigations | Optical Navigation, Gesture Quick Navigation | |||
| Automatic Functions | Auto Brightness Contrast, Auto Focus, Automatic Dissipation | |||
| Special Functions | Intelligent Assisted Dispersion, *Large-Scale Image Stitching (Optional accessories) | |||
| Installation Requirements | Space | L≥ 3000 mm, W ≥ 4000 mm, H ≥ 2300 mm | ||
| Temperature | 20°C (68°F) ~ 25°C (77°F) | |||
| Humidity | ≤ 50 % | |||
| Power Supply | AC 220 V(±10 %), 50 Hz, 2 kVA | |||
Common Chip-1
Common Chip-2
Negative Electrode - Carbon
Negative Electrode - Carbon Coated Silicon
Anode - Lithium Cobaltate
Anode - Lithium Manganate
Solar Cell-1
Solar Cell-2
High Polymer Foam
Catalyst-MOF Materials
