Tungsten Filament Scanning Electron Microscope | SEM3200
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CIQTEK SEM3200 is a high-performance tungsten filament scanning electron microscope. It has excellent image quality, low vacuum mode compatibility, high resolution images in different fields of view. The depth of field is large and the image is rich in stereo.
Extended Scalability and Functionalities
Optical Navigation
Quickly locate target samples and areas of interest
*Large-Scale Image Stitching
Fully automatic map picking and stitching to display a large field of view
Image Blending (SE+BSE)
Observe the composition and surface information of a sample in one image
*Dual Anode Structure
Improved resolution and imaging quality at low voltages
*Low Vacuum Mode
Provide sample surface details and morphology in low vacuum, software switch vacuum state with one click
Low Voltage
Models SEM3200A SEM3200
Electro-Optical Systems Electron Gun Pre-aligned medium-sized fork-type tungsten filament
Resolution High Vaccum 3 nm @ 30 kV (SE)
4 nm @ 30 kV (BSE)
8 nm @ 3 kV (SE)
*Low Vaccum 3 nm @ 30 kV (SE)
Magnification 1-300,000x (Film Magnification)
1-1000,000x (Screen Magnification)
Acceleration Voltage 0.2 kV ~ 30 kV
Probe Current ≥1.2μA, Real-time display
Imaging Systems Detector Secondary Electron Detector (ETD)
*Backscattered electron detector (BSED), *low vacuum secondary electron detector, *energy spectrometer EDS, etc.
Image Format TIFF, JPG, BMP, PNG
Vacuum System Vacuum Model High Vacuum Better than 10-4 Pa
Low Vacuum 5 ~ 1000 Pa
Control Mode Fully automatic control
Sample Chamber Camera Optical Navigation
Monitoring in the Sample Chamber
Sample Table Three Axis Automatic Five Axis Automatic
Distance X: 120 mm X: 120 mm
Y: 115 mm Y: 115 mm
Z: 50 mm Z: 50 mm
/ R: 360°
/ T: -10° ~ +90°
Software Operating System Windows
Navigations Optical Navigation, Gesture Quick Navigation
Automatic Functions Auto Brightness Contrast, Auto Focus, Automatic Dissipation
Special Functions Intelligent Assisted Dispersion, *Large-Scale Image Stitching (Optional accessories)
Installation Requirements Space L≥ 3000 mm, W ≥ 4000 mm,
H ≥ 2300 mm
Temperature 20°C (68°F) ~ 25°C (77°F)
Humidity ≤ 50 %
Power Supply AC 220 V(±10 %), 50 Hz, 2 kVA
Applications of Scanning Electron Microscope

Common Chip-1

Common Chip-2

Negative Electrode - Carbon

Negative Electrode - Carbon Coated Silicon

Anode - Lithium Cobaltate

Anode - Lithium Manganate

Solar Cell-1

Solar Cell-2

High Polymer Foam

Catalyst-MOF Materials

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