Home > Products > Applied Rigaku Technologies Inc.
Technique | Direct excitation energy dispersive X-ray fluorescence (EDXRF) |
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Benefit | Combines performance and affordability; elemental analysis of solids, liquids, powders, alloys, and thin films |
Technology | EDXRF using a high-performance Si-PIN diode detector (NEX QC model) or high- performance silicon drift detector (NEX QC+ model) |
Attributes | 50 kV 4 W X-ray tube, high-performance semiconductor detector, embedded computer, icon-driven graphical user interface, built-in printer, USB and Ethernet connections, analyze Na to U |
Options | Helium purge, automatic sample changers, single-position sample spinner, UPS, portable carrying case |
Dimensions | 31 (W) x 376 (H) x 432 (D) mm |
Mass | Approx. 16 kg |
Power requirements | 1Ø, 100 – 240 V, 1.4 A (50/60 Hz) |