Technique |
Direct excitation energy dispersive X-ray fluorescence (EDXRF) |
Benefit |
Combines performance and affordability; elemental analysis of solids, liquids,
powders, alloys, and thin films |
Technology |
EDXRF using a high-performance Si-PIN diode detector (NEX QC model) or high-
performance silicon drift detector (NEX QC+ model) |
Attributes |
50 kV 4 W X-ray tube, high-performance semiconductor detector, embedded
computer, icon-driven graphical user interface, built-in printer, USB and Ethernet
connections, analyze Na to U |
Options |
Helium purge, automatic sample changers, single-position sample spinner, UPS,
portable carrying case |
Dimensions |
31 (W) x 376 (H) x 432 (D) mm |
Mass |
Approx. 16 kg |
Power
requirements |
1Ø, 100 – 240 V, 1.4 A (50/60 Hz) |