TIMA-X
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TIMA-X is an automated mineralogy system enabling fast quantitative analysis of rocks, ores, concentrates, tailings, leach residues or smelter products.The new detectors on TIMA-X are specially designed to increase sensitivity to light elements and maintain excellent resolution stability at high throughput rates without compromising the interactive and automated performance.
Features
- Very fast and fully automated data acquisition process reached via SEM and EDX high level hardware integration
- EDAX Element Silicon Drift Detectors
- New design of 30 mm2 SDD CMOS chip
- Si3N4 window is rugged, non-porous and has high transmissivity
- Improved sensitivity to low energies for light element detection
- Pulse processor software integration
- Compatible with EDAX Quant hardware and with EDAX µXRF
- Newly designed exchangeable sample holder with integrated fixed BSE/EDX calibration standard and Faraday cup
- Up to 4 integrated EDX detectors for maximum system performance
- New Peltier cooled EDX detector type for thermal stability guarantee
- Improved approach to data analysis increasing speed and reliability od process
- Variable dwell time and EDX analysis duration adapting to each part of the sample
- Offline data inspection
Applications
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